dc.contributor.author |
Poyraz, Muhammet |
|
dc.contributor.author |
Gorgulu, Kazim |
|
dc.contributor.author |
Sisman, Zulkarneyn |
|
dc.contributor.author |
Tanrikulu, Mahmud Yusuf |
|
dc.contributor.author |
Okyay, Ali Kemal |
|
dc.date.accessioned |
2019-11-18T05:57:28Z |
|
dc.date.available |
2019-11-18T05:57:28Z |
|
dc.date.issued |
2017-03 |
|
dc.identifier.citation |
Poyraz, M., Gorgulu, K., Sisman, Z., Tanrikulu, M. Y., & Okyay, A. K. (2017). LWIR all-atomic layer deposition ZnO bilayer microbolometer for thermal imaging. Optical Engineering, 56(3), 037106. https://doi.org/10.1117/1.OE.56.3.037106 |
tr_TR |
dc.identifier.issn |
0091-3286 |
|
dc.identifier.issn |
1560-2303 |
|
dc.identifier.uri |
http://openaccess.adanabtu.edu.tr:8080/xmlui/handle/123456789/571 |
|
dc.identifier.uri |
https://doi.org/10.1117/1.OE.56.3.037106 |
|
dc.description |
WOS indeksli yayınlar koleksiyonu. / WOS indexed publications collection. |
|
dc.description.abstract |
We propose an all-ZnO bilayer microbolometer, operating in the long-wave infrared regime that can be implemented by consecutive atomic layer deposition growth steps. Bilayer design of the bolometer provides very high absorption coefficients compared to the same thickness of a single ZnO layer. High absorptivity of the bilayer structure enables higher performance (lower noise equivalent temperature difference and time constant values) compared to single-layer structure. We observe these results computationally by conducting both optical and thermal simulations. |
tr_TR |
dc.language.iso |
en |
tr_TR |
dc.publisher |
OPTICAL ENGINEERING / SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS |
tr_TR |
dc.relation.ispartofseries |
2017;Volume: 56 Issue: 3 |
|
dc.subject |
uncooled infrared imaging |
tr_TR |
dc.subject |
Optics |
|
dc.subject |
atomic layer deposition |
|
dc.subject |
zinc oxide |
|
dc.title |
LWIR all-atomic layer deposition ZnO bilayer microbolometer for thermal imaging |
tr_TR |
dc.type |
Article |
tr_TR |